Path coefficient and correlation assessment in sorghum (Sorghum bicolor L.)

An investigation was carried out with 18 sorghum genotypes and five released varieties of sorghum to assess association of grain yield components and their direct and indirect effects on grain yield per plant during 2012 and 2013 growing seasons at Zonal Agricultural Research Station, Solapur, India. Highly significant variation was recorded among the genotypes for various morphological and yield traits. Results of correlation analysis indicated that leaf area (0.616), leaf area index (0.615), panicle length (0.531), biomass per plant (0.837) and panicle yield per plant (0.942) had positive and highly significant correlation with grain yield whereas the positive and non-significant correlation was found between days to 50% flowering (0.153), days to maturity (0.056), 1000 seed weight (0.027), harvest index (0.294) and grain yield. There were negative and non-significant correlations between plant height (−0.063), panicle diameter (−0.284) and grain yield per plant. Leaf area index (2.719), biomass per plant (0.852), harvest index (0.507) and panicle yield per plant (0.132) had higher positive direct effect on grain yield, whereas lower positive effect of plant height (0.015), panicle diameter (0.004) and days to maturity (0.003) on grain yield was witnessed. Leaf area (−2.685), days to 50% flowering (−0.021) and 1000 seed weight (−0.042) had negative direct effects on grain yield. Positive indirect effect on grain yield was maximum through days to 50% flowering (1.254), leaf area (2.719), panicle length (1.014), days to maturity (1.074), biomass per plant (1.433) and panicle yield per plant (1.472) whereas its maximum indirect negative effect was through days to 50% flowering (−1.236), leaf area index (−2.685), panicle length (−1.004), etc.