Design and development of experimental setup to measure the RRR values of a thin film coated superconducting sample

Bulk Niobium cavities are currently used in superconducting radio frequency applications. Superconducting thin films can replace them as they have great potential to overcome the fundamental limitation of the bulk cavities. For thin films to be successfully implemented, systematic studies on structural properties are necessary. Superconducting Radio Frequency (SRF) technology is widely adopted in particle accelerators. Here we use residual resistance ratio (RRR) value as a measure to determine the purity of metal, which is defined as ratio of resistivity of metal at 300K to residual resistivity at 4.2 K. This paper discusses about design and development of an experimental setup and data acquisition system and its validation with standard resistor. This will be used for measurement of RRR values of niobium coated samples in future experiments. The measurement of resistance is carried out using NI-DAQ and LabVIEW 11.0 software. Cold electronics pre-amplifier used for signal conditioning also is discussed.