1Associate Professor, Bhagwant Institute of Technology, Muzaffarnagar (U.P.), India, E-mail: ajaydr_gupta@yahoo.co.in
2Assistant Professor, Department of Mathematics, SRMS College of Engineering & Technology, Bhojipura, Bareilly (U.P), India, sunarn2012@gmail.com
3Reasearch Scholar, Bhagwant Universtiy, Ajmer (Rajasthan), nancykingdom@rediffmail.com
Online published on 6 October, 2018.
The paper presents continuous time based Software reliability growth model (SRGM). The model incorporates Wiener process which represent fluctuations in fault detection process. Model also considers time dependent fault detection rate which is approximated by log logistic test effort function(TEF).Weibull TEF based SRGM compared with proposed log logistic TEF based SRGM using statistical tools SSE, R2 and AIC. Results suggest that proposed model fits in real time scenario and predict faults detection data better.
NHPP Models, Test Effort Function, Wiener process, Akaike's Information Criterion
